Tools | Technology
Tools
Atomic absorption AA spectrometers - Atomic absorption spectrometers
Binocular light compound microscopes - Differential interference contrast DIC microscopes
- Fluorescence optical microscopes
- Optical inspection microscopes
- Optical profilers
Capacitance meters - Capacitance-voltage C-V plotters
Cryogenic temperature controllers Drying cabinets or ovens - Critical point dryers
- Spin dryers
- Spin rinse dryers
Electronic measuring probes Handheld refractometers or polarimeters Impedance meters - Four-point probes
- Impedance analyzers
Infrared dryers - Ultraviolet UV exposure units
Laboratory evaporators - Electron beam evaporators
- Filament evaporators
- Resistance evaporators
- Thermal evaporators
Laboratory safety furnaces - Ashing systems
- Atmospheric furnaces
- Oxidation furnaces
Lasers - Pulsed laser systems
- Tunable lasers
Light scattering equipment Microprocessors - Graphics processing units GPU
Microtomes - Cryocut microtomes
- Ultramicrotomes
Optical diffraction apparatus Polarizing microscopes - Raman scattering microscopes
| Reciprocating shaking water baths - Reciprocating shaker water baths
Scanning electron microscopes - Field emission scanning electron microscopes FESEM
- Focused ion beam scanning electron microscopes FIB-SEM
- Scanning auger microscopes
- Scanning electron microscopes SEM
Scanning light or spinning disk or laser scanning microscopes - Confocal Raman microscopes
- Laser scanning confocal microscopes
Scanning probe microscopes - Atomic force microscopes AFM
- Scanning tunneling microscopes STM
Semiconductor process systems - Atomic layer deposition ALD systems
- Contact mask aligners
- Downstream strippers
- Electron beam lithography systems
- Image reversal ovens
- Inductively coupled plasma reactive ion etchers ICP-RIE
- Ion mills
- Low pressure chemical vapor deposition LPCVD systems
- Magnetron sputtering systems
- Mask writers
- Metal-organic chemical vapor deposition MOCVD systems
- Molecular beam epitaxy MBE systems
- Nanoimprint lithography NIL systems
- Oxide etchers
- Parylene deposition systems
- Plasma cleaning systems
- Plasma enhanced chemical vapor deposition PECVD systems
- Sputter coaters
- Ultrasonic cutters
- Wafer bond aligners
- Wafer bonding systems
- Wafer saws
- Wafer spinners
- Wire bonders
Semiconductor testers - Semiconductor parameter analyzers
Signal generators - Laser pattern generators
- Optical pattern generators
Spectrometers - Energy dispersive x-ray EDX spectroscopes
- Raman scattering spectroscopes
- Secondary ion mass spectrometers SIMS
- X-ray photoelectron spectrometers
Surface testers - Profilometers
- Surface profilers
Temperature cycling chambers or thermal cyclers - Rapid thermal annealers RTA
Thermal differential analyzers Thickness measuring devices - Ellipsometers
- Scanning ellipsometers
- Spectroscopic ellipsometers
Transmission electron microscopes - Transmission electron microscopes TEM
Tumblers or polishers - Chemical mechanical polishing CMP systems
- Lapping machines
Video attachments for microscopes Voltage or current meters X ray diffraction equipment |
Technology
Analytical or scientific software - CP2K *
- CPMD *
- CSC Elmer software
- Data acquisition software
- DL_POLY *
- ESA MOSAICS
- Finite difference time domain FDTD software
- General Atomic and Molecular Electronic Structure System GAMESS *
- LAMMPS Molecular Dynamics Simulator *
- NWChem *
- QuantumWise Atomistix ToolKit
- SEMC-2D
- Simulation software
- UTQUANT *
- Vienna Ab-Initio Simulation Package VASP
Computer aided design CAD software - Autodesk AutoCAD software
- Breault Research ASAP
- Dassault Systemes SolidWorks software
- IMSI Design DesignCAD
- LinkCAD
- Optical Research Associates LightTools
- PTC Pro/ENGINEER software
- Tanner EDA L-Edit
| Computer aided manufacturing CAM software - Rapid prototyping software
Development environment software - National Instruments LabVIEW
Graphics or photo imaging software - Adobe Systems Adobe Freehand
Operating system software |
We welcome feedback on the Tools & Technology database. We encourage you to suggest tools and technologies where our coverage may not reflect the full range of an occupation's duties. All suggestions will be considered for a future update of the T2 database.
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* Software developed by a government agency and/or distributed as freeware or shareware.
